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Submicrometer-Resolution Polychromatic 3D X-Ray Microscopy

Published

Author(s)

B C. Larson, Lyle E. Levine

Abstract

The ability to study the structure, microstructure, and evolution of materials with increasing spatial resolution is fundamental to achieving a full understanding of the underlying science of materials. Polychromatic 3D x-ray microscopy (3DXM) is a recently-developed, non-destructive, diffraction technique that enables crystallographic phase identification, determination of local crystal orientations, and determination of the deviatoric elastic strain tensor with submicrometer spatial resolution in all three dimensions. With the added capability of an energy scanning incident beam monochromator, the determination of absolute lattice parameters is enabled allowing specification of the complete elastic strain tensor with 3D spatial resolution. The methods associated with 3DXM are described and key applications of 3DXM are discussed including studies of deformation in metals and semiconductors, thermal grain growth in polycrystalline aluminum, the metal-insulator transition in nanoplatelet VO2, indentation deformation, interface strengths in metal-matrix composites, and electromigration processes. Finally, the outlook for future developments associated with this technique is described.
Citation
Journal of Applied Crystallography
Volume
46

Keywords

X-ray diffraction, nanoscale diffraction, 3D X-ray diffraction, X-ray imaging review

Citation

Larson, B. and Levine, L. (2013), Submicrometer-Resolution Polychromatic 3D X-Ray Microscopy, Journal of Applied Crystallography, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=911568 (Accessed December 10, 2023)
Created January 14, 2013, Updated October 12, 2021