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Structural analysis of multilayer graphene via atomic moiré interferometry



David L. Miller, Kevin Kubista, Gregory M. Rutter, Ming Ruan, Walt A. de Heer, Phillip First, Joseph A. Stroscio


The rotation of stacked honeycomb lattices produces an observable moir e pattern in the topography of scanning tunneling microscopy images, which have long been observed in highly-oriented pyrolytic graphite due to rotation of the surface layer relative to layers below. Here, we observe the combined e ect of three-layer moir e patterns in graphene grown on SiC(000 1). Small angle rotations between the first and third layer are shown to produce a double-moir e pattern, resulting from the beat frequencies of interfering moir e patterns of the first three layers. Additionally, unconventional patterns are also observed due to relative lattice strain between the layers. We model the moir e patterns as a beating of the mismatched reciprocal lattice vectors and show how moir e patterns can be used to determine the relative strain between lattices.
Physical Review B


graphene, silicon carbide, scanning tunneling microscopy


Miller, D. , Kubista, K. , Rutter, G. , Ruan, M. , de Heer, W. , First, P. and Stroscio, J. (2010), Structural analysis of multilayer graphene via atomic moiré interferometry, Physical Review B, [online], (Accessed May 24, 2024)


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Created March 23, 2010, Updated October 12, 2021