Zhang, N.
, Sedransk, N.
and Jarrett, D.
(2002),
Statistical Uncertainty Analysis of CCEM-K2 Comparisons of Resistance Standards, 2002 Conference on Precision Electromagnetic Measurements (CPEM 2002) and IEEE Transactions on Instrumentation and Measurements, Ottawa, (Accessed May 15, 2026)
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Statistical Uncertainty Analysis of CCEM-K2 Comparisons of Resistance Standards
Published
Author(s)
, ,
Abstract
Details of the statistical uncertainty analysis applied to key comparison CCEM-K2 are reported. Formulas were derived to determine the uncertainty of the combined difference between the measurements of multiple artifacts by an NMI and the corresponding predictions based on pilot lab measurements. In addition, the uncertainties of the reference value of the key comparison and the degrees of equivalence between two NMI¿s are obtained.Proceedings Title
2002 Conference on Precision Electromagnetic Measurements (CPEM 2002) and IEEE Transactions on Instrumentation and Measurements
Conference Dates
June 1, 2002
Conference Location
Ottawa,
Conference Title
Conference on Precision Electromagnetic Measurements
Pub Type
Conferences
Keywords
National Metrology Institute, reference value, weighted mean
Citation
Issues
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Created June 1, 2002, Updated February 17, 2017