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Statistical Uncertainty Analysis of CCEM-K2 Comparisons of Resistance Standards

Published

Author(s)

Nien F. Zhang, N Sedransk, Dean G. Jarrett

Abstract

Details of the statistical uncertainty analysis applied to key comparison CCEM-K2 are reported. Formulas were derived to determine the uncertainty of the combined difference between the measurements of multiple artifacts by an NMI and the corresponding predictions based on pilot lab measurements. In addition, the uncertainties of the reference value of the key comparison and the degrees of equivalence between two NMI¿s are obtained.
Proceedings Title
2002 Conference on Precision Electromagnetic Measurements (CPEM 2002) and IEEE Transactions on Instrumentation and Measurements
Conference Dates
June 1, 2002
Conference Location
Ottawa,
Conference Title
Conference on Precision Electromagnetic Measurements

Keywords

National Metrology Institute, reference value, weighted mean

Citation

Zhang, N. , Sedransk, N. and Jarrett, D. (2002), Statistical Uncertainty Analysis of CCEM-K2 Comparisons of Resistance Standards, 2002 Conference on Precision Electromagnetic Measurements (CPEM 2002) and IEEE Transactions on Instrumentation and Measurements, Ottawa, (Accessed June 23, 2024)

Issues

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Created June 1, 2002, Updated February 17, 2017