Ferguson, M.
, Lee, Y.
, Narayanan, A.
and Law, K.
(2019),
A Standardized PMML Format for Representing Convolutional Neural Networks with Application to Defect Detection, Smart and Sustainable Manufacturing Systems, [online], https://doi.org/10.1520/SSMS20190032, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=928776
(Accessed February 7, 2025)