Published: July 25, 2012
Han-Jong H. Chia, Feng Guo, Lyubov Belova, Robert D. McMichael
We report a demonstration of spectroscopic defect imaging in an array of ferromagnetic structures using ferromagnetic resonance force microscopy (FMRFM). The arrray of 200 nm diameter circular dots includes a single oval-shaped defect. The technique resolves not only intentional differences in resonant field between the dots and the oval, but also differences between nominally identical circular dots in the array.
Citation: Applied Physics Letters
Pub Type: Journals
Ferromagnetic resonance, nanomagnetics, magnetic microscope
Created July 25, 2012, Updated February 19, 2017