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PUBLICATIONS

Software Tools for Uncertainty Evaluation in VNA Measurements: A Comparative Study

Published

Author(s)

Gustavo Avolio, Dylan Williams, Michael Frey, Sarah B. Streett, Dominique Schreurs, Andrea Ferrero, Michael Dieudonne

Abstract

We compared three software tools designed for scattering-parameter measurement uncertainty evaluation. These tools propagate uncertainty to calibrated S-parameters by means of a sensitivity analysis. We also validated the sensitivity analysis with Monte-Carlo simulations performed with one of the software tools and the Keysight ADS circuit simulator.
Proceedings Title
Advanced Technologies for Communications
Conference Dates
June 9, 2017
Conference Location
Honolulu, HI, US
Conference Title
89th ARFTG Microwave Measurement Symposium
Pub Type
Conferences

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Keywords

Microwave measurements, Monte-Carlo simulations, sensitivity analysis, S-parameters, uncertainty
Uncertainty quantification, Metrology, Electronics and Advanced communications

Citation

Avolio, G. , Williams, D. , Frey, M. , Streett, S. , Schreurs, D. , Ferrero, A. and Dieudonne, M. (2017), Software Tools for Uncertainty Evaluation in VNA Measurements: A Comparative Study, Advanced Technologies for Communications, Honolulu, HI, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922806 (Accessed October 14, 2025)

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Created June 8, 2017, Updated April 19, 2022
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