In-Situ Torque Magnetometry: Magnetic Coupling in Fe/Cr/Fe Thin-Film Systems

Published

October 31, 2008

Author(s)

Dong-Hoon Min, S. B. Lee, John M. Moreland

Abstract

We have developed an ultra-sensitive torque magnetometer tailored to the study of thin-film interface magnetism and interlayer magnetic exchange coupling. The magnetometer was composed of an optical-fiber interferometer and a customized silicon cantilever that was fabricated using silicon micro-electromechanical system (MEMS) technology. The performance of the magnetometer was gauged by measureing the couplings of the Fe/Cr/Fe trilayer system deposited on a Si <110> substrate. The antiferomagnetic stacking of the Cr layers of the Fe/Cr/Fe system and the parallel or the antiparallel coupling between the bottom Fe and the top Fe layers with various Cr spacer thicknesses were monitored by using a MEMS torque magnetometer. We found short- (2.05 ML Cr spacer thickness) and long-period (13.80 ML Cr spacer thickness) oscillations of the interlayer exchange coupling of the Fe/Cr/Fe trilayer system.

Citation

Journal of the Korean Physical Society

Volume

53

Issue

4

Pub Type

Journals

Keywords

MEMS torque magnetometer, Cantilever, Interlayer exchange coupling

Citation

Min, D. , Lee, S. and Moreland, J. (2008), In-Situ Torque Magnetometry: Magnetic Coupling in Fe/Cr/Fe Thin-Film Systems, Journal of the Korean Physical Society (Accessed October 14, 2025)