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In Situ Atomic Scale Imaging of Electrochemical Lithiation of Silicon

Published

Author(s)

Xiao Hua Liu, Sergiy Krylyuk, Albert Davydov, Jian Yu Huang

Abstract

In lithium-ion batteries, the electrochemical reaction between the electrodes and lithium is a critical process that controls the capacity, cyclability and reliability of the battery. Despite intensive study, the atomistic mechanism of the electrochemical reactions occurring in these solid-state electrodes remains unclear. Here, we show that in situ transmission electron microscopy can be used to study the dynamic lithiation process of single-crystal silicon with atomic resolution. We observe a sharp interface (∼1 nm thick) between the crystalline silicon and an amorphous LixSi alloy. The lithiation kinetics are controlled by the migration of the interface, which occurs through a ledge mechanism involving the lateral movement of ledges on the close-packed 111} atomic planes. Such ledge flow processes produce the amorphous LixSi alloy through layer-by-layer peeling of the 111} atomic facets, resulting in the orientation-dependent mobility of the interfaces.
Citation
Nature Nanotechnology
Volume
7

Keywords

lithium ion battery, ledge mechanism, interfacial mobility anisotropy, in-situ transmission electron microscopy

Citation

Liu, X. , Krylyuk, S. , Davydov, A. and Huang, J. (2012), In Situ Atomic Scale Imaging of Electrochemical Lithiation of Silicon, Nature Nanotechnology (Accessed June 24, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 6, 2012, Updated October 12, 2021