Zhu, X.
, Li, Q.
, Ioannou, D.
, Gu, H.
, Baumgart, H.
, Bonevich, J.
, Suehle, J.
and Richter, C.
(2009),
Silicon Nanowire Nonvolatile-Memory with Varying HfO2 Charge Trapping Layer Thickness
(Accessed January 22, 2025)
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Silicon Nanowire Nonvolatile-Memory with Varying HfO2 Charge Trapping Layer Thickness
Published
Author(s)
Xiaoxiao Zhu, Qiliang Li, D. E. Ioannou, H Gu, Helmut Baumgart, , ,
Pub Type
Talks
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Issues
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Created December 8, 2009, Updated October 12, 2021