Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Seebeck Coefficient Metrology: Do Contemporary Protocols Measure Up?



Joshua B. Martin, Winnie K. Wong-Ng, Martin L. Green


Comparative measurements of the Seebeck coefficient are challenging due to the diversity of instrumentation and measurement protocols. With the implementation of standardized measurement protocols and the use of Standard Reference Materials (SRMs®), for example, the recently certified NIST SRM® 3451 “Low Temperature Seebeck Coefficient Standard (10 K - 390 K)”, researchers can reliably analyze and compare data, both intra- and inter-laboratory, thereby accelerating the development of more efficient thermoelectric materials and devices. We present a comparative overview of commonly adopted Seebeck coefficient measurement practices. First, we examine the influence of asynchronous temporal and spatial measurement of electric potential and temperature. Second, we examine the influence of poor thermal contact between the measurement probes and the sample. This is especially critical at high temperature, wherein the prevalent mode of measuring surface temperature is facilitated by pressure contact. Each topic will include the comparison of data measured using different measurement techniques and using different probe arrangements. Using these analyses, we provide recommended measurement protocols to guide members of the thermoelectric materials community in performing more accurate measurements and in evaluating more comprehensive uncertainty limits.
Journal of Electronic Materials


thermoelectric, Seebeck coefficient, metrology, thermal contact


Martin, J. , Wong-Ng, W. and Green, M. (2015), Seebeck Coefficient Metrology: Do Contemporary Protocols Measure Up?, Journal of Electronic Materials, [online], (Accessed April 23, 2024)
Created January 29, 2015, Updated November 10, 2018