Seebeck Coefficient Metrology: Do Contemporary Protocols Measure Up?

Published

January 29, 2015

Author(s)

Joshua B. Martin, Winnie K. Wong-Ng, Martin L. Green

Abstract

Comparative measurements of the Seebeck coefficient are challenging due to the diversity of instrumentation and measurement protocols. With the implementation of standardized measurement protocols and the use of Standard Reference Materials (SRMs®), for example, the recently certified NIST SRM® 3451 “Low Temperature Seebeck Coefficient Standard (10 K - 390 K)”, researchers can reliably analyze and compare data, both intra- and inter-laboratory, thereby accelerating the development of more efficient thermoelectric materials and devices. We present a comparative overview of commonly adopted Seebeck coefficient measurement practices. First, we examine the influence of asynchronous temporal and spatial measurement of electric potential and temperature. Second, we examine the influence of poor thermal contact between the measurement probes and the sample. This is especially critical at high temperature, wherein the prevalent mode of measuring surface temperature is facilitated by pressure contact. Each topic will include the comparison of data measured using different measurement techniques and using different probe arrangements. Using these analyses, we provide recommended measurement protocols to guide members of the thermoelectric materials community in performing more accurate measurements and in evaluating more comprehensive uncertainty limits.

Citation

Journal of Electronic Materials

Volume

44

Pub Type

Journals

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DOI Link

Keywords

thermoelectric, Seebeck coefficient, metrology, thermal contact

Citation

Martin, J. , Wong-Ng, W. and Green, M. (2015), Seebeck Coefficient Metrology: Do Contemporary Protocols Measure Up?, Journal of Electronic Materials, [online], https://doi.org/10.1007/s11664-015-3640-9 (Accessed December 13, 2024)