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Search Publications by: Kin (Charles) Cheung (Assoc)

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Displaying 251 - 252 of 252

THE FAST INITIAL THRESHOLD VOLTAGE SHIFT: NBTI OR HIGH-FIELD STRESS

April 27, 2008
Author(s)
Jason P. Campbell, Kin P. Cheung, John S. Suehle
Recent 'NBTI' studies have come to involve very high electric fields, yet these same studies are used to criticize the lower field 'NBTI' models. This study examines both high- and low-field degradation phenomena by monitoring the initial threshold voltage
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