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Search Publications by: Amanda L. Forster (Fed)

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Displaying 126 - 127 of 127

An XPS Study on the Effects of Pigment on the UV Degradation of an Epoxy System

November 14, 2003
Author(s)
S J. Scierka, Amanda L. Forster, Wendy E. Kosik, Jonathan W. Martin
X-ray photoelectron spectroscopy (XPS) is a powerful tool that has been used to monitor the changes in chemistry on the surface of many materials. In this study it is used to examine the chemical changes in an epoxy system formulated with and without