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Search Publications by: Mary T. Laamanen (Fed)

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Displaying 1 - 10 of 10

Results from a Black-Box Study for Digital Examiners

February 17, 2022
Author(s)
Barbara Guttman, Mary T. Laamanen, Craig Russell, James Darnell, Chris Atha
The National Institute of Standards and Technology (NIST) conducted a black-box study in conjunction with a scientific foundation review documented in NISTIR 8354 – Digital Investigation Techniques: A NIST Scientific Foundation Review (initially released

Inferring previously uninstalled applications from digital traces

May 25, 2017
Author(s)
Jim Jones, Tahir Kahn, Kathryn B. Laskey, Alexander J. Nelson, Mary T. Laamanen, Douglas R. White
In this paper, we present an approach and experimental results to suggest the past presence of an application after the application has been uninstalled and the system has remained in use. Current techniques rely on the recovery of intact artifacts and

Assessment of Closed Circuit Television Digital Video Recording and Export Technologies

March 6, 2017
Author(s)
Michael Garris, Mary T. Laamanen, Craig S. Russell, Lawrence D. Nadel
The National Institute of Standards and Technology (NIST) in collaboration with the Federal Bureau of Investigation (FBI) conducted research to define and recommend an interoperable data solution to assist law enforcement in acquiring and analyzing digital

Recommendation: Closed Circuit Television(CCTV) Digital Video Export Profile - Level 0

December 12, 2016
Author(s)
Michael Garris, Mary T. Laamanen, Craig S. Russell, Lawrence D. Nadel
This document is a recommendation prescribing a data interchange format for the syntactic representation of information needed to achieve a base "Level 0" of interoperability when exporting and processing video recordings captured by closed circuit

HL7 Experimental Registry

December 12, 2005
Author(s)
William J. Majurski, A Mccaffrey, Mary T. Laamanen
Our results extending Kuhn's fault class hierarchy provide a justification for the focus of fault-based testing strategies on detecting particular faults and ignoring others. We develop a novel analytical technique that allows us to elegantly prove that

NIST/XDS Test Kit, Version 1.5

December 1, 2004
Author(s)
William J. Majurski, A Mccaffrey, Mary T. Laamanen
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

NIST/XDS Test Kit, Version 1.3 & 1.4

November 1, 2004
Author(s)
William J. Majurski, A Mccaffrey, Mary T. Laamanen
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

NIST/XDS Text Kit, Version 1.0, 1.1 & 1.2

October 1, 2004
Author(s)
William J. Majurski, A Mccaffrey, Mary T. Laamanen
The goal of this document is to help W3C editors write better specifications, by making a specification easier to interpret without ambiguity and clearer as to what is required in order to conform. It focuses on how to define and specify conformance. It

Flits: Pervasive Computing for Processor and Memory Constrained Systems

January 1, 2000
Author(s)
William J. Majurski, Alden A. Dima, Mary T. Laamanen
Many pervasive computing software technologies are targeted for 32-bit desktop platforms. However, there are innumerable 8, 16, and 32-bit microcontroller and microprocessor-based embedded systems that do not support the resource requirements of these