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Search Publications by Nada T. Golmie

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Displaying 1 - 25 of 125

Wireless Channel Model Development Across the Product Life Cycle

David Michelson, Camillo A. Gentile, Nada T. Golmie, Jeanne T. Quimby, Catherine A. Remley, Ken Gracie, Yvo de Jong
Wireless channel models play a critical role at all stages of the product life cycle, from standards development to network deployment. However, the distinctive

Millimeter-Wave Channel Measurement and Modeling: A NIST Perspective

Camillo A. Gentile, Peter B. Papazian, Nada T. Golmie, Catherine A. Remley, Peter G. Vouras, Jelena Senic, Jian Wang, Jack Chuang, Ruoyu Sun
The exponential increase in wireless data transmission from smartphones has led to the saturation of the sub-6-GHz bands, forcing cellular providers to migrate

Millimeter-Wave Propagation Channels vs. Synthetic Beamwidth

Roy Sun, Camillo A. Gentile, Jelena Senic, Peter G. Vouras, Peter B. Papazian, Nada T. Golmie, Catherine A. Remley
High-gain narrow-beam antennas or beamformed antenna arrays will likely be used in millimeter- wave (mmWave) bands and 5G to mitigate the high path loss. Since

A 3D Topology Optimization Scheme for M2M Communications

Yalong Wu, Wei Yu, Jin Zhang, David W. Griffith, Nada T. Golmie
Without efficient topology management, M2M communications will likely asymmetrically congest gateways and eNodeBs in 3rd Generation Partnership Project (3GPP)

A Dynamic Rate Adaptation Scheme for M2M Communications

Yalong Wu, Wei Yu, David W. Griffith, Nada T. Golmie
The number of Machine-to-Machine (M2M) devices has continued to grow at an accelerated rate. Without thoughtful and efficient resource management, M2M

Future Generation Wireless R&D Gaps Report

Nada T. Golmie
This report identifies and describes several of the most significant gaps within various components of the wireless industry. This report is intended to serve

Measurement Challenges for 5G and Beyond

Catherine A. Remley, Jeffrey A. Jargon, Joshua A. Gordon, Alexandra E. Curtin, David R. Novotny, Christopher L. Holloway, Robert D. Horansky, Michael S. Allman, Jeanne T. Quimby, Camillo A. Gentile, Peter B. Papazian, Ruoyu Sun, Damir Senic, Jelena Senic, Matthew T. Simons, Maria G. Becker, Dylan F. Williams, Richard A. Chamberlin, Jerome G. Cheron, Ari D. Feldman, Paul D. Hale, Mohit S. Mujumdar, Nada T. Golmie
National Metrology Institutes (NMIs) around the world are charged with supporting industry through improved measurement science and by providing a traceability