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Search Publications by: Raghu N Kacker (Fed)

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Displaying 126 - 150 of 373

Tower of Covering Arrays

April 25, 2015
Author(s)
Raghu N. Kacker, Jose Torres Jimenez
Covering arrays are combinatorial objects that have several practical applications, specially in the design of experiments for software and hardware testing. A covering array CA(N;t,k,v) of strength t and order v is an N×k array over Z v with the property

Introducing Combinatorial Testing in a Large Organization

April 23, 2015
Author(s)
Jon Hagar, Thomas Wissink, D. Richard Kuhn, Raghu N. Kacker
A two-year study of eight pilot projects to introduce combinatorial testing in a large aerospace corporation found that the new methods were practical, significantly lowered development costs, and improved test coverage by 20 to 50 percent.

Constraint Handling In Combinatorial Test Generation Using Forbidden Tuples

April 13, 2015
Author(s)
Raghu N. Kacker, David R. Kuhn, Yu Lei
Constraint handling is a challenging problem in combinatorial test generation. In general, there are two ways to handle constraints, i.e., constraint solving and forbidden tuples. In our early work we proposed a constraint handling approach based on

Improving IPOGs Vertical Growth Based on a Graph Coloring Scheme

April 13, 2015
Author(s)
Raghu N. Kacker, David R. Kuhn, Yu Lei
In this paper, we show that the vertical growth phase of IPOG is optimal for t-way test generation when t = 2, but it is no longer optimal when t is greater than 2. We present an improvement that reduces the number of tests generated during vertical growth

Calibration Considerations for Mission Success

April 1, 2015
Author(s)
Raghu N. Kacker
As more and more data from different sensors, either on the same or from different platforms, are used together for studies of changes in the earth’s atmosphere and surface properties, Department of Defense applications, or for the many other applications

Combinatorial Coverage as an Aspect of Test Quality

March 31, 2015
Author(s)
David R. Kuhn, Raghu N. Kacker, Yu Lei
There are relatively few good methods for evaluating test set quality, after ensuring basic requirements traceability. Structural coverage, mutation testing, and related methods can be used if source code is available, but these approaches may entail

Obtaining a Trapezoidal Distribution

March 9, 2015
Author(s)
James F. Lawrence, Raghu N. Kacker, Ruediger Kessel
Given a most believed value for a quantity together with upper and lower possible deviations from that value, a rectangular distribution might be used to represent state-of-knowledge about the quantity. If the deviations are themselves known by probability

An Empirical Comparison of Combinatorial and Random Testing

April 4, 2014
Author(s)
Raghu N. Kacker, David R. Kuhn
Some conflicting results have been reported on the comparison between t-way combinatorial testing and random testing. In this paper, we report a new study that applies t-way and random testing to the Siemens suite. In particular, we investigate the

An Empirical Comparison of Combinatorial and Random Testing

April 1, 2014
Author(s)
Laleh Ghandehari, Jacek Czerwonka, Yu Lei, Soheil Shafiee, Raghu N. Kacker, D. Richard Kuhn
Some conflicting results have been reported on the comparison between t-way combinatorial testing and random testing. In this paper, we report a new study that applies t-way and random testing to the Siemens suite. In particular, we investigate the

Estimating Fault Detection Effectiveness

April 1, 2014
Author(s)
David R. Kuhn, Raghu N. Kacker, Yu Lei
[Poster] A t-way covering array can detect t-way faults, however they generally include other combinations beyond t-way as well. For example, a particular test set of all 5-way combinations is shown capable of detecting all seeded faults in a test program