Scattering Measurements for High Throughput Materials Science Research

Published

January 1, 2004

Author(s)

A I. Norman, J Cabral, Alamgir Karim, Eric J. Amis

Abstract

High throughput scattering methods are employed to study phase behavior over a concentration gradient of either Polystyrene (PS) in a Polystyrene/Polybutadiene (PS/PB) blend, or of diblock copoly(ethyleneoxide-butyleneoxide) in water. The combinatorial approach uses discrete multiple samples removing the need for preparing each individual sample and reducing experimental acquisition time since the samples do not need to be loaded individually and no realignment procedures are required. X-ray scattering techniques are used to study the ethyleneoxide (EO)/butyleneoxide (BO) system since they cover length scales ranging from a few angstroms (Wide angle x-ray scattering, WAXS) to hundreds of nanometers (Small angle x-ray scattering, SAXS). All SAXS/WAXS experiments are carried out at the NSLS at Brookhaven National Laboratory 1, where the flux is significantly higher than conventional lab sources. In this work we used a 25-well array (with sample volume 150 mL) spanning concentrations of 0 % by mass fraction to 20 % by mass fraction in increments of 0.8 %. Over this chosen concentration regime, the vesicle structure was known to exist.2 Vesicles are excellent candidates for controlled release materials. Applications of such materials include pharmaceuticals, agricultural applications and personal care products. 3-5 Such structures were also probed by small angle neutron scattering (SANS) studies and compared to SANS studies of micelles.

Citation

Macromolecular Rapid Communications

Volume

25

Issue

No. 1

Pub Type

Journals

Download Paper

Local Download

Keywords

high throughput measurements, small angle x-ray scattering, vesicles

Citation

Norman, A. , Cabral, J. , Karim, A. and Amis, E. (2004), Scattering Measurements for High Throughput Materials Science Research, Macromolecular Rapid Communications, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852319 (Accessed October 27, 2025)