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Review of standard test method IEC-62607-6-4 : Graphene - Non-contact conductance measurement using resonant cavity

Published

Author(s)

Jan Obrzut

Abstract

The IEC 62607-6-4 establishes a method for determining the surface conductance of two-dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite]. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz. Surface conductance measurement by resonant cavity involves the cavity quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area and subsequent solution of the cavity perturbation nist-equations. The conductance measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area. The method can be extended to determine quality of the 2D materials. The quality characterization is based on the measurement of the resonant frequency shift that is characteristic of multi-domain defect boundaries causing the 2D electronic states to extend into 3-D.
Citation
Grace Consortium; IEC TC113

Keywords

Graphene, 2D materials, Surface Conductance, Sheet resistance, Microwave cavity, Non-contact, Non-destructive, Multi-domain defects
Created July 18, 2019, Updated September 6, 2019