Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Reflectance Standards at Ultraviolet Wavelengths

Published

Author(s)

P Y. Barnes, E A. Early, Maria E. Nadal

Abstract

Polytetrafluoroethylene (PTFE) is widely used in remote sensing applications requiring a diffuse reflectance standard for detector calibration. The bi-directional and directional-hemispherical reflectance properties of both pressed and sintered PTFE were measured at ultraviolet wavelengths (200 nm to 400 nm) to provide information for their use as standards in this spectral range. The reflectance decreases with decreasing wavelength for both geometries, and the ratio between the reflectances for these geometries remains constant for wavelengths from 300 nm to 400 nm.
Citation
SPIE series

Keywords

bidirectional reflectance distribution f, diffuse reflectance, PTFE, reflectance, ultraviolet

Citation

Barnes, P. , Early, E. and Nadal, M. (1999), Reflectance Standards at Ultraviolet Wavelengths, SPIE series (Accessed May 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 2, 1999, Updated February 17, 2017