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Refinements in Phase Fraction Determination of Textured Alloys from Transmission Diffraction Data



Adam Abel Creuziger, Thien Q. Phan, Darren Pagan


Use of high energy synchrotron x-ray diffraction sources is becoming increasingly common for high quality phase fraction measurements and microstructural evolution experiments. While the high flux, large volume illuminated, and large number of diffraction vectors should reduce common sources of uncertainty and bias, the distribution of the diffraction vectors may still cause bias in the phase fraction measurement. This hypothesis of bias is investigated with example experimental data and synthetic data. The authors find that there may be bias depending on the sample texture, distribution of diffraction vectors, and the hkl planes used in the phase fraction measurement, even for nearly complete coverage of a pole figure. The authors developed a series of geometry-based correction values that reduced the measurement bias due to sampling scheme and texture in the phase fraction measurement by an order of magnitude. The efficacy of these corrections is demonstrated with application to both experimental and synthetic data.
Journal of Applied Crystallography


Creuziger, A. , Phan, T. and Pagan, D. (2021), Refinements in Phase Fraction Determination of Textured Alloys from Transmission Diffraction Data, Journal of Applied Crystallography, [online],, (Accessed June 20, 2024)


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Created October 7, 2021, Updated October 14, 2021