Rukhin, A.
(2015),
Random Effects Model for Bias Estimation: Higher Order Asymptotic Inference, Biometrics
(Accessed September 11, 2024)
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Random Effects Model for Bias Estimation: Higher Order Asymptotic Inference
Published
Author(s)
Abstract
A common issue in metrology is to validate or to calibrate laboratory's method. To solve this problem a lab performs measurements on a certified reference material with a given coverage interval. Assuming that the measurand is random with a normal distribution whose parameters are obtained from the reference material certificate, new remarkably accurate confidence intervals for the bias are derived. These procedures are based on modern higher order asymptotic statistical methods.Citation
Biometrics
Pub Type
Journals
Keywords
Bartlett correction, Certified reference materials, Confidence interval, Higher order asymptoticl inference, Skovgaard statistic.
Citation
Issues
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Created May 31, 2015, Updated January 27, 2020