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Random Effects Model for Bias Estimation: Higher Order Asymptotic Inference

Published

Author(s)

Andrew L. Rukhin

Abstract

A common issue in metrology is to validate or to calibrate laboratory's method. To solve this problem a lab performs measurements on a certified reference material with a given coverage interval. Assuming that the measurand is random with a normal distribution whose parameters are obtained from the reference material certificate, new remarkably accurate confidence intervals for the bias are derived. These procedures are based on modern higher order asymptotic statistical methods.
Citation
Biometrics

Keywords

Bartlett correction, Certified reference materials, Confidence interval, Higher order asymptoticl inference, Skovgaard statistic.

Citation

Rukhin, A. (2015), Random Effects Model for Bias Estimation: Higher Order Asymptotic Inference, Biometrics (Accessed May 19, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 31, 2015, Updated January 27, 2020