Newbury, D.
and Ritchie, N.
(2021),
Quantitative Electron-Excited X-ray Microanalysis with Low Energy L-Peaks, Microscopy and Microanalysis, [online], https://doi.org/10.1017/S1431927621012617, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929533
(Accessed October 17, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Quantitative Electron-Excited X-ray Microanalysis with Low Energy L-Peaks
Published
Author(s)
,
Abstract
Quantitative electron-excited X-ray microanalysis that follows the standards-based intensity ratio method produces accurate results and an analytical total near unity based upon extensive testing on known materials. This paper investigates a significant departure from this experience when low photon energy L-shell peaks below 1 keV are measured with a pure element serving as the peak fitting reference and standard. This deviation can be greatly reduced and brought within the normal range by using a stoichiometric compound or other multi-element material to serve as the reference and standard.Citation
Microscopy and Microanalysis
Volume
27
Pub Type
Journals
Download Paper
Keywords
electron-excited X-ray microanalysis, quantitative analysis, L-shell characteristic X-rays
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created August 12, 2021, Updated September 29, 2025