Quantitative Electron-Excited X-ray Microanalysis with Low Energy L-Peaks
Dale E. Newbury, Nicholas Ritchie
Quantitative electron-excited X-ray microanalysis that follows the standards-based intensity ratio method produces accurate results and an analytical total near unity based upon extensive testing on known materials. This paper investigates a significant departure from this experience when low photon energy L-shell peaks below 1 keV are measured with a pure element serving as the peak fitting reference and standard. This deviation can be greatly reduced and brought within the normal range by using a stoichiometric compound or other multi-element material to serve as the reference and standard.
and Ritchie, N.
Quantitative Electron-Excited X-ray Microanalysis with Low Energy L-Peaks, Microscopy and Microanalysis, [online], https://doi.org/10.1017/S1431927621012617
(Accessed March 4, 2024)