Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Quantitative Characterization of DNA Films by X-ray photoelectron spectroscopy

Published

Author(s)

D Y. Petrovykh, H Y. Kimura-Suda, Michael J. Tarlov, L J. Whitman

Abstract

Self-assembled films of thiolated poly(dT)25 single-stranded DNA (ssDNA) on gold areintroduced as a model system for quantitative characterization of DNA films by XPS. Weevaluate the applicability of a simple substrate-overlayer model for data analysis, examine model parameters used to describe DNA films, e.g. density and electron attenuation length, and carry out a number of self-consistency checks. The model is used to obtain quantitative composition and coverage information as a function of immobilization time. When the electron attenuation effects are properly included in the XPS data analysis, we obtain excellent agreement with IR measurements for relative values of the DNA coverage, and a calculated absolute coverage value consistent with a previous radiolabeling study. The validation of the analysis procedure for the modelpoly(dT)25 ssDNA film supports its generalization for direct quantitative comparison ofDNA films prepared under widely varying conditions.
Citation
Surface and Interface Analysis
Volume
20
Issue
2

Keywords

attenuation, composition, coverage, DNA, gold, immobilization, uncertainty, XPS

Citation

Petrovykh, D. , Kimura-Suda, H. , Tarlov, M. and Whitman, L. (2004), Quantitative Characterization of DNA Films by X-ray photoelectron spectroscopy, Surface and Interface Analysis (Accessed June 16, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 19, 2004, Updated October 12, 2021