Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Quantifying Strain via Buckling Instabilities in Surface Modified Polymer Brushes

Published

Author(s)

Cassandra M. Reese, Wei Guo, Brittany J. Thompson, Phillip K. Logan, Christopher Stafford, Derek L. Patton

Abstract

We present a quantitative method of measuring the compressive strain of wrinkled polymer films and coatings with knowledge of the "skin" thickness, wrinkle wavelength, and wrinkle amplitude. The derived analytical expression is validated with a well-studied model system, e.g., stiff, thin film (PS) bonded to a thick, compliant substrate (PDMS), comparing the applied strain and calculated strain for a series of PS film thicknesses. After validation, we use the analytical expression to quantify the applied swelling strain of previously reported wrinkled poly(styrene-alt-maleic anhydride) brush surfaces after surface modification, where the swelling strain was determined to increase with anhydride conversion in the "skin" layer of the modified brush. Finally, the applied strain is used to rationalize the observed persistence length of aligned wrinkles created during AFM lithography and subsequent solvent exposure. The ability to accurately determine the applied strain in wrinkled systems adds another tool to the metrology of instabilities in polymer thin films and coatings.
Citation
Macromolecules
Volume
53
Issue
11

Keywords

wrinkling, polymers, thin films, polymer brushes, strain

Citation

Reese, C. , Guo, W. , Thompson, B. , Logan, P. , Stafford, C. and Patton, D. (2020), Quantifying Strain via Buckling Instabilities in Surface Modified Polymer Brushes, Macromolecules, [online], https://doi.org/10.1021/acs.macromol.9b02412, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929072 (Accessed April 24, 2024)
Created May 20, 2020, Updated October 12, 2021