Lo, S.
and Heilweil, E.
(2011),
Pulse Terahertz Reflection/Scattering Measurement, SPIE Conference Proceedings, [online], https://doi.org/10.1117/12.893520
(Accessed October 8, 2024)
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Pulse Terahertz Reflection/Scattering Measurement
Published
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Abstract
We report a method to measure reflection and scattering from several samples with different degrees of surface roughness and material properties at terahertz frequencies. Reflection from a flat gold mirror shows that the full width half maximum (FWHM) of the terahertz beam angular spread is 0.2 THz with signal-to-noise of 65 dB. Measurement of a paper index card, which is used as a low scattering sample shows that the reflection/scattering properties are essentially similar to the system signature response except for multiple reflections between the front and back surfaces of the sample. Sixty-grit sandpaper shows multiple scattering events with almost no signal reflected from the flat backing paper surface. Corduroy cloth shows periodic reflections in the time domain, which translated to diffraction lobes in the spectral domain.Citation
SPIE Conference Proceedings
Volume
8119
Pub Type
Journals
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Keywords
BRDF, concealed threat detection, millimeter wave and terahertz imaging, terahertz reflection and scattering
Citation
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Created September 7, 2011, Updated November 10, 2018