Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Precision and Accuracy of Thermal Calibration of Atomic Force Microscopy Cantilevers

Published

Author(s)

G A. Matei, E J. Thoreson, Jon R. Pratt, David B. Newell, N A. Burnham

Abstract

To have confidence in force measurements made with atomic force microscopes (AFMs), the spring constant of the AFM cantilevers should be known with good precision and accuracy, topics not yet thoroughly treated in the literature. In this study, we compared the stiffnesses of uncoated tipless uniform retangular silicon cantilevers among thermal, loading, and geometric calibration methods; loading was done against an SI-traceable artifact from NIST. The precision and accuracy of the thermal method were found to be 5 and 10% respectively. Force measurements taken with different cantilevers can now be meaningfully compared.
Citation
Review of Scientific Instruments
Volume
77

Keywords

atomic force microscopes, cantilever springs, standard reference measurement and practices

Citation

Matei, G. , Thoreson, E. , Pratt, J. , Newell, D. and Burnham, N. (2006), Precision and Accuracy of Thermal Calibration of Atomic Force Microscopy Cantilevers, Review of Scientific Instruments (Accessed April 17, 2024)
Created December 31, 2005, Updated October 12, 2021