In this paper we present an optical imaging tool, the Overlay Imaging Aligner (OIA), developed to aid in the mechanical alignment of antenna components in the mm-wave and low-THz frequency regimes (50-500GHz) where the millimeter and sub-millimeter wavelengths pose significant challenges for alignment. The OIA uses a polarization-selective, machine-vision approach to generate two simultaneous and overlaid real-time digital images along a common axis. This allows for aligning two antenna components to within fractions of a wavelength in the mm-wave and THz frequency regimes. The overall concept, optical design, function, performance characteristics and application examples are presented. Preliminary data at specific frequencies in the WR-2.2 band are presented that compare the alignment achieved with the OIA to an electrical alignment.
Citation: IEEE Transactions on Instrumentation and Measurement
Pub Type: Journals
Alignment, electromagnetic testing, instrumentation, microwave measurements, millimeter wave measurements, THz, waveguide, imaging