Precise Measurement of Enthalpy of Sublimation of Ne, N2, O2, Ar, CO2, Kr, Xe, and H2O using an Internally Consistent Sensing Platform

Published

November 15, 2017

Author(s)

Hamza Shakeel, Haoyan Wei, Joshua M. Pomeroy

Abstract

We report precise experimental values of the enthalpy of sublimation (∆H_s) of quenched condensed films of neon (Ne), nitrogen (N2), oxygen (O2), argon (Ar), carbon dioxide (CO2), krypton (Kr), xenon (Xe), and water (H2O) vapor using a single consistent measurement platform. A 6 cm2 and 400 µm thick double paddle oscillator (DPO) with high quality factor (Q) and excellent frequency stability is utilized for the measurements. The experiments are performed well below the triple point temperature of each gas and fall in the temperature range where existing experimental data is very limited. The enthalpies of sublimation are derived by measuring the rate of mass loss during programmed temperature desorption. The mass change is detected due to change in the resonance frequency of the self-tracking oscillator. We identified and controlled many sources of uncertainty in our study and performed a comprehensive error propagation analysis. Our measurements are in excellent agreement with the available literature, theory, and NIST Web Thermo Tables (WTT) values, but are performed using an internally consistent method. The final mean values of enthalpy of sublimation of each gas and the corresponding experiment temperatures are listed in the table below

Citation

Journal of Chemical Thermodynamics

Volume

118

Pub Type

Journals

Download Paper

https://doi.org/10.1016/j.jct.2017.11.004

Local Download

Keywords

Enthalpy of sublimation, neon, nitrogen, oxygen, argon, carbon dioxide, krypton, xenon and water, double paddle oscillator

Citation

Shakeel, H. , Wei, H. and Pomeroy, J. (2017), Precise Measurement of Enthalpy of Sublimation of Ne, N2, O2, Ar, CO2, Kr, Xe, and H2O using an Internally Consistent Sensing Platform, Journal of Chemical Thermodynamics, [online], https://doi.org/10.1016/j.jct.2017.11.004, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921657 (Accessed October 28, 2025)