A Platform for Observing the Behavior of AFM Cantilevers During Quasi-Static Loading
Jon R. Pratt, Lee M. Kumanchik, Tony L. Schmitz
This paper describes a platform for studying the bending behavior of ultra-compliant (stiffness less than 1 N/m) atomic force microscope (AFM) cantilevers. The fundamental issue is that a cantilever does not represent an ideal design for precision force measurement due to the parasitic motion of the tip under load. For ultra-compliant cantilevers, the combination of a high adhesive force at the tip and parasitic motion can lead to proportionally substantial lateral (in-plane) forces. In addition, the tip-surface adhesive force can increase the propensity for sticking which is a considerable concern for colloidal probes due to the increased contact surface. These effects can manifest as deviate bending behavior and have been suggested as confounding contact style force calibration/measurement since force is commonly related to tip displacement by an assumed bending model.
, Kumanchik, L.
and Schmitz, T.
A Platform for Observing the Behavior of AFM Cantilevers During Quasi-Static Loading, ASPE 23rd Annual Meeting & 12th ICPE, Portland, OR, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=824719
(Accessed February 25, 2024)