Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

The Orientation of Semifluorinated Alkanes Attached to Polymers at the Surface of Polymer Films

Published

Author(s)

Jan Genzer, E Sivaniah, E K. Kramer, J G. Wang, H Kerner, M Xiang, K Char, Christopher K. Ober, B M. DeKoven, Robert A. Bubeck, M K. Chaudhury, S Sambasivan, Daniel A. Fischer

Abstract

The surface molecular orientation of a liquid crystalline (LC) layer made up a semi-fluorinated (SF) single side-groups [-CO-(CH2)x-1-(CF2)yF] (single SF groups) attached to polyisoprene homopolymer or the isoprene block of a styrene-isoprene diblock copolymer was determined by analyzing the partial electron yield C-edge NEXAFS signal. The results show that the surfaces of thin SF polymer films are covered with a uniform layer, consisting of the SF-LC groups whose average -CF2- tilt angle with the surface normal lies in the range 29 to 46 . This is in direct contrast to the bulk, where the directors of the SF-LC mesogens are aligned parallel to the polystyrene/SF-polyisoprene interface of the block copolymers. This average tilt angle increases with increasing the length of the -(CH2)x-1- group (x increases) but decreases with increasing the length of the -(CF2)1- part of the molecule (y increases) at constant x.
Citation
Macromolecules
Volume
33
Issue
No. 5

Keywords

polymer films, semifluorinated alkanes

Citation

Genzer, J. , Sivaniah, E. , Kramer, E. , Wang, J. , Kerner, H. , Xiang, M. , Char, K. , Ober, C. , DeKoven, B. , Bubeck, R. , Chaudhury, M. , Sambasivan, S. and Fischer, D. (2000), The Orientation of Semifluorinated Alkanes Attached to Polymers at the Surface of Polymer Films, Macromolecules (Accessed December 8, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 29, 2000, Updated October 12, 2021