Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

A Novel Low-Cost High-Throughput Probe Card Scanner Analyzer for Characterization of Magnetic Tunnel Junctions

Published

Author(s)

Philip Pong, Moshe Schmoueli, E Marcus, William F. Egelhoff Jr.

Abstract

The advancement of the technology of magnetic tunnel junctions (MTJs) greatly hinges on the optimization of the magnetic materials, fabrication process, and annealing conditions which involve characterization of a large number of samples. As such, it is of paramount importance to have a rapid-turnaround characterization method since the characterization process can take even longer time than the fabrication. Conventionally, micropositioners and probe tips are manually operated to perform 4-point electrical measurement on each individual device which is a time-consuming, low-throughput process. A commercial automatic probe card analyzer can provide high turnaround; however, it is expensive and involves much cost and labor to install and maintain the equipment. In view of this, we have developed a novel low-cost, home-made, high-throughput probe card analyzer system for characterization of MTJs. It can perform fast 4-probe electrical measurements including current vs voltage, magnetoresistance, and bias dependence measurements with a high turnaround of about 500 devices per hour. The design and construction of the system is discussed in detail in this paper.
Citation
SPIE

Keywords

alignment, magnetic tunnel junctions, probe card analyzer, tunneling magnetoresistance

Citation

Pong, P. , Schmoueli, M. , Marcus, E. and Egelhoff Jr., W. (2008), A Novel Low-Cost High-Throughput Probe Card Scanner Analyzer for Characterization of Magnetic Tunnel Junctions, SPIE (Accessed June 25, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 16, 2008