Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Near Edge X-Ray Absorption Fine Structure Characterization of Polymers Based on 2-Vinyl-4,5-Dieyanoimidazole

Published

Author(s)

A L. Marsh, D J. Burnett, Daniel A. Fischer, P G. Rasmussen, J L. Gland

Abstract

Polymer thin films are used for a variety of applications ranging from microelectronics to coatings. New polymers, designed with specific applications in mind are currently being developed. Polyvinazene, a poly(imidazole) based on the monomer 2-vinyl-4,5-dicyaniomidazole (vinazene), is a thermally stable material that is acidic with a pKa of 5.5-.1-3 It is soluble in aqueous base and is also soluble in very polar organic solvents, so it can be easily processed into thin films. Applications for this new material range from high-temperature coatings to catalytic supports. For these applications, it is critical that surface properties be well-understood. Near Edge X-Ray Absorption Fine Structure, or NEXAFS, is an element-specific spectroscopic technique that provides information on the structure and bonding of functional groups present at the surface of polymer films.4-8 In the present work, thin films of polyvinazene and a copolymer with styrene, poly(vinazene-co-styrene), have been characterized using NEXAFS at the C-K-edge and the N-K-edge.
Citation
Polymeric Materials: Science & Engineering
Volume
84

Keywords

NEXAFS, polymers, surface analysis, thin films

Citation

Marsh, A. , Burnett, D. , Fischer, D. , Rasmussen, P. and Gland, J. (2001), Near Edge X-Ray Absorption Fine Structure Characterization of Polymers Based on 2-Vinyl-4,5-Dieyanoimidazole, Polymeric Materials: Science & Engineering (Accessed December 5, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2000, Updated October 12, 2021