Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Nanocharacterization of Surface and Interface of Different Epoxy Networks

Published

Author(s)

Xiaohong Gu, D T. Raghavan, D L. Ho, Li Piin Sung, Mark R. VanLandingham, Tinh Nguyen

Abstract

The effect of network changes on the surface and interface properties of amine-cured epoxy has been investigated. Samples of different crosslinked epoxies are prepared by mixing stoichiometrically pure diglycidyl ether of bisphenol A (n=0.03) with different ratios of 1,3-bis(aminomethyl)cyclohexane (terafunctional amine) and cyclohexylmethylamine (difunctional amine). All samples are cured in CO2-free air. Both the film surface in contact with air and that in contact with the silicon substrate (the interface) are analyzed using atomic force microscopy (AFM) and nanoindentation. Small angle neutron scattering (SANS), attenuated total reflection Fourier transform infrared (ATR-FTIR) spectroscopy, and contact angle measurements, are used to assist in the interpretation of AFM results. Substantial morphological and mechanical differences are observed between the surface and the interface for different crosslinked epoxies. The findings have strong implications on the wettablity, adhesion, and durability of amine-cured epoxies.
Citation
MRS Proceedings
Volume
710

Keywords

amine-cured epoxy, atomic force microscopy, crosslinking density, epoxy networks, Small angle neutron scattering, surface and interface

Citation

Gu, X. , Raghavan, D. , Ho, D. , Sung, L. , VanLandingham, M. and Nguyen, T. (2002), Nanocharacterization of Surface and Interface of Different Epoxy Networks, MRS Proceedings, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=860415 (Accessed October 17, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 1, 2002, Updated February 19, 2017
Was this page helpful?