Multi-Probe Assembly

Published

December 31, 2007

Author(s)

John Wason, William Gressick, J Wen, Jason J. Gorman, Nicholas Dagalakis

Abstract

This paper describes the algorithm development and experimental results of a multi-probe micro-assembly system. The experimental testbed consists of two actuated probes, an actuated die stage, and vision feedback. The kinematics relationships for the probes, die stage, and part manipulation are derived and used for calibration and kinematics-based planning and control. Particular attention has been focused on the effect of adhesion forces in probe-part and partstage contacts in order to achieve grasp stability and robust part manipulation. By combining pre-planned manipulation sequences and vision based manipulation, repeatable spatial (in contrast to planar) manipulation and insertion of a submillimeter part has been demonstrated. The insertion process only requires the operator to identify two features to initialize the calibration, and the remaining tasks involving part pick-up, manipulation, and insertion are all performed autonomously.

Proceedings Title

3rd Annual IEEE Conference on Automation Science and Engineering (CASE 2007)

Conference Dates

September 22-25, 2007

Conference Location

Scottsdale, AZ, US

Pub Type

Conferences

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Keywords

MEMS, microassembly, microprobe

Citation

Wason, J. , Gressick, W. , Wen, J. , Gorman, J. and Dagalakis, N. (2007), Multi-Probe Assembly, 3rd Annual IEEE Conference on Automation Science and Engineering (CASE 2007), Scottsdale, AZ, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=823626 (Accessed March 5, 2025)