Wason, J.
, Gressick, W.
, Wen, J.
, Gorman, J.
and Dagalakis, N.
(2007),
Multi-Probe Assembly, 3rd Annual IEEE Conference on Automation Science and Engineering (CASE 2007), Scottsdale, AZ, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=823626
(Accessed April 25, 2024)
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Multi-Probe Assembly
Published
Author(s)
John Wason, William Gressick, J Wen, ,
Abstract
This paper describes the algorithm development and experimental results of a multi-probe micro-assembly system. The experimental testbed consists of two actuated probes, an actuated die stage, and vision feedback. The kinematics relationships for the probes, die stage, and part manipulation are derived and used for calibration and kinematics-based planning and control. Particular attention has been focused on the effect of adhesion forces in probe-part and partstage contacts in order to achieve grasp stability and robust part manipulation. By combining pre-planned manipulation sequences and vision based manipulation, repeatable spatial (in contrast to planar) manipulation and insertion of a submillimeter part has been demonstrated. The insertion process only requires the operator to identify two features to initialize the calibration, and the remaining tasks involving part pick-up, manipulation, and insertion are all performed autonomously.Proceedings Title
3rd Annual IEEE Conference on Automation Science and Engineering (CASE 2007)
Conference Dates
September 22-25, 2007
Conference Location
Scottsdale, AZ, US
Pub Type
Conferences
Download Paper
Keywords
MEMS, microassembly, microprobe
Citation
Created December 30, 2007, Updated October 12, 2021