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Morphological origins of polarization-induced scattering anisotropy from organic thin films

Published

Author(s)

Eliot Gann, Brian A. Collins, Maolong Tang, John R. Tumbleston, Subhrangsu Mukherjee, Harald W. Ade

Abstract

Anisotropic scattering patterns have been observed from organic thin films that are isotropic on the scale of the probe in polarized resonant X-ray scattering experiments. The symmetry is broken by local correlations between molecular orientation and domain structure interacting with polarized X- rays. Two morphological paradigms potentially exhibiting these effects, each of high interest in organic electronics, are simulated. These simulations reveal that detailed examination of the anisotropy allows unambiguous identification of the alignment mechanism and that anisotropy is distinct from and complementary to isotropic scattering intensity as a measure of thin film microstructure.
Citation
Journal of Synchrotron Radiation

Keywords

Resonant X-ray Scattering, Small-Angle X-ray Scattering, Polarization-Induced Scattering Anisotropy, Orientational Ordering, Scattering Simulation, Babinet's Principle, Polymer-Fullerene Blends, Organic Electronics

Citation

Gann, E. , Collins, B. , Tang, M. , Tumbleston, J. , Mukherjee, S. and Ade, H. (2016), Morphological origins of polarization-induced scattering anisotropy from organic thin films, Journal of Synchrotron Radiation (Accessed June 20, 2024)

Issues

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Created January 13, 2016, Updated October 12, 2021