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The Molar Volume of Silicon: Discrepancies and Limitations

Published

Author(s)

R Deslattes, Ernest G. Kessler

Abstract

We offer a new representation of the current silicon molar volume discrepancy by attending to a previously incorrect accounting of the early work at the National Bureau of Standards (NBS). Removal of a poorly documented correction to the NBS density scale lends to a plausibly correct description of the molar volume anomaly problem. The possibility of discrepant metrology has been previously ruled out by sample exchanges. This led to several materials characterization exercises that gave important null results as briefly summarized here. We report the first non-null results and examine their correlation with those samples with discrepant molar volume values. In the end, there is a reasonably optimistic prospect that concordant and accurate density values can emerge at an interesting level of significance (less than 10-7). A brief discussion of intrinsic limitations of melt-grown crystals is included.
Citation
IEEE Transactions on Instrumentation and Measurement

Keywords

metrology, silicon molar volume

Citation

Deslattes, R. and Kessler, E. (1999), The Molar Volume of Silicon: Discrepancies and Limitations, IEEE Transactions on Instrumentation and Measurement (Accessed April 19, 2024)
Created April 1, 1999, Updated February 17, 2017