NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Modeling and metrology of metallic nanowires with application to microwave interconnects

Published

Author(s)

Kichul Kim, Thomas M. Wallis, Paul Rice, Chin J. Chiang, Atif A. Imtiaz, Pavel Kabos, Jintao Zhang

Abstract

Abstract: Broadband characterization of individual metallic nanowires for microwave interconnect applications is discussed. Circuit and method of moments (MoM) modeling are benchmarked using a set of coplanar waveguide (CPW) test devices with microwire Au interconnect and air gaps in the middle of the CPW. Comparison with measurements reveals significantly larger errors from circuit models though all dimensions are much smaller than wavelength. Similar CPW devices hosting 100 nm and 250 nm diameter Pt nanowires (NWs) are then investigated to determine the ranges of conductivity and contact resistance for each Pt NW. An algorithm that utilizes the transmission line theory and different nanowire lengths to determine the actual conductivity and contact resistance is proposed and validated.
Proceedings Title
IEEE MTT-S International Microwave Symposium
Conference Dates
May 23-28, 2010
Conference Location
Anaheim, CA
Pub Type
Conferences

Download Paper

DOI Link

Keywords

Interconnects, nanowires, modeling, measurement, conductivity, contact impedance.
Manufacturing, Metrology and Nanoelectronics

Citation

Kim, K. , Wallis, T. , Rice, P. , Chiang, C. , Imtiaz, A. , Kabos, P. and Zhang, J. (2010), Modeling and metrology of metallic nanowires with application to microwave interconnects, IEEE MTT-S International Microwave Symposium , Anaheim, CA, [online], https://doi.org/10.1109/MWSYM.2010.5518053 (Accessed October 10, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created May 23, 2010, Updated November 10, 2018
Was this page helpful?