Williams, D.
, Chamberlin, R.
, Cheron, J.
, Zhao, W.
and Miguel, U.
(2016),
Model Verification with Measurement Uncertainty, IEEE Transactions on Microwave Theory and Techniques, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920140
(Accessed April 20, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Model Verification with Measurement Uncertainty
Published
Author(s)
, , , Wei Zhao, Urteaga Miguel
Abstract
We verify a model for state-of-the-art 250 nm heterojunction bipolar transistors with large-signal measurements. We demonstrate the propagation of correlated measurement uncertainties through the model-extraction and verification process, and use them to quantify the differences we observe in the measurements and models, and the accuracy of the model parameters we extract.Citation
IEEE Transactions on Microwave Theory and Techniques
Pub Type
Journals
Download Paper
Keywords
measurement uncertainty, microwave measurement, model verification, transistor model
Citation
Created November 1, 2016, Updated April 4, 2019