Microwave Properties of Low-Temperature Co-Fired Ceramic Systems
Richard G. Geyer, Liang Chai, Aziz Shaikh, Vern Stygar
Co-fired, patterned multi-layer ceramic structures can provide RF designers with the means for compact, dense microwave circuit and component design spanning the frequency range from 800 MHz to 77 GHz. Critical parameters affecting the performance of these low-temperature co-fired ceramic (LTCC) systems are the dielectric properties of the co-fired ceramic and the metal loss occurring in the patterned circuit. These parameters have different frequency and temperature dependencies, and their contributions to total insertion loss therefore change as a function of application frequency temperature. The contributions to microstrip attenuation loss of each of these critical parameters are analyzed at 10 GHz. Various dielectric resonator methods are used for accurate determinations of the substrate intrinsic dielectric properties and the metal surface resistance. These data were used to evaluate individual contributing factors of attenuation loss. The total computed attenuation loss compared well with that measured with a microstrip ring resonator. This characterization aids the optimal development of multi-layer electronic circuits for the application frequency. It also provides the material scientist with the necessary focus on important dielectric, metallization, and fabrication processing application packages.
Attenuation, conductor losses, dielectric, low-temperature co-fired ceramic, microwave, permittivity, radio frequency characterization, substrate