Geyer, R.
and Krupka, J.
(2001),
Microwave Dielectric Property Measurements, Journal of the American Ceramic Society
(Accessed April 19, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Microwave Dielectric Property Measurements
Published
Author(s)
, Jerzy Krupka
Abstract
Materials, whether in the solid, liquid or gaseous states, may be electrically nonlinear, anisotropic, inhomogeneous and dispersive with respect to frequency. Dispersion results from loss mechanisms that differ in different types of materials and vary with temperature. Dielectric loss tangent measurements reflect the different loss mechanisms occurring in a material place in an electric field. Because of all these factors, both measurement techniques and accuracies for evaluation of dielectric properties are requisite for physical understanding. Various permittivity and dielectric loss tangent measurement techniques, including low-frequency complex impedance, free space, waveguide transmission and reflection, and resonance methods are reviewed. Measurement uncertainties are also discussed.Citation
Journal of the American Ceramic Society
Pub Type
Journals
Keywords
anisotropic, dielectric, dispersion, loss tangent, microwave measurements permittivity, polarization, relaxation distribution
Citation
Created January 1, 2001, Updated February 19, 2017