NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Microscopy and Microanalysis of Individual Collected Particles- Chapter 10
Published
Author(s)
Robert A. Fletcher, Nicholas W. Ritchie, Ian M. Anderson, John A. Small
Abstract
This chapter describes microscopy and microanalysis techniques used for the characterization of collected, individual particles in a variety of instruments. The instruments discussed are the light microscope, electron microscopes (both scanning and transmission), electron microprobes, laser, optical, scanning probe and ion microprobes. The principles of operation and the instrumental capabilities are presented. The chapter also contains some basic information about sample preparation, useful for the aerosol scientist.
Citation
Aerosol Measurement
Publisher Info
John Wiley & Sons, Inc., Hoboken, NJ
Pub Type
Book Chapters
Keywords
individual particle analysis, Microanalysis, microprobes, single particle, collected aerosol
Citation
Fletcher, R.
, Ritchie, N.
, Anderson, I.
and Small, J.
(2011),
Microscopy and Microanalysis of Individual Collected Particles- Chapter 10, Aerosol Measurement, John Wiley & Sons, Inc., Hoboken, NJ
(Accessed October 17, 2025)