Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Micromechanical Instruments for Ferromagnetic Measurements



John M. Moreland


I review some of the novel methods for measuring ferromagnetic properties of thin films based on micromechanical magnetometers. Measurements rely on the detection of mechanical forces or torques on samples deposited onto microcantilevers. Displacements of the cantilever are detected by optical methods similar to those developed for atomic force microscopy. High sensitivities are achieved by integrating the sample with the detector, allowing magnetic measurements of samples with a total magnetic moment smaller than that detectable with conventional magnetometers. Cantilevers with low spring constants and high mechanical Q are essential for these measurements. Sensitivities better than 105 υB are possible at room temperature with the potential for single spin detection below 1 K, where the thermomechanical noise of micromechanical sensors is substantially reduced.
Journal of Physics D-Applied Physics


atomic force microscope (AFM), calorimeter, ferromagnetic resonance FMR), gradient magnetometer, M-H loops, microelectromechanical systems MEMS), micromechanical detector, microwave instrumentation, torque magnetometer


Moreland, J. (2003), Micromechanical Instruments for Ferromagnetic Measurements, Journal of Physics D-Applied Physics, [online], (Accessed April 17, 2024)
Created January 1, 2003, Updated February 19, 2017