Micro FTIR Mapping of Nanometer Ferroelectric Polymer Films

Published

January 1, 2006

Author(s)

Naomi Eidelman, N Tsutsumi, C. K. Chiang

Abstract

Highly crystalline ferroelectric polymer nanometer ultra thin films were characterized with FTIR microspectroscopy mapping technique. The thickness of spin-coated vinyidene fluoride and trifluoroethylene P(VDF-TrFE) copolymer thin films was ranged from 260 nm down to 15 nm. Their local structure was measured using FTIR reflectance-transmission microspectroscopy (FTIR-RTM) in 400 mm X 400 mm film areas. The amorphous and crystalline fractions were identified locally. By mapping large areas (1x1 cm) the FTIR-RTM maps provided a unique in-depth view of polymeric ultra thin films. The results obtained from the thinner films show that thinner thickness suppresses the growth of the crystalline phase. The increase in the amorphous phase leads to non-uniform films at the low nanometer level, which degraded the ferroelectric behavior for application.

Citation

Macromolecular Rapid Communications

Volume

27

Pub Type

Journals

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Keywords

FTIR microspectroscopy, thin films, Trifluoroethylene, vinyidene fluoride

Citation

Eidelman, N. , Tsutsumi, N. and Chiang, C. (2006), Micro FTIR Mapping of Nanometer Ferroelectric Polymer Films, Macromolecular Rapid Communications, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852558 (Accessed September 15, 2024)