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Metrological Assessment of Single-Walled Carbon Nanotube Materials by Optical Methods

Published

Author(s)

Jeffrey A. Fagan, Angela R. Hight Walker, Ming Zheng, Lefebvre Jacques, Paul Finnie

Abstract

This chapter discusses the metrology – i.e. the science of measurement – of single-wall carbon nanotubes (SWCNTs) with optical methods. Professor Mildred (“Millie”) Dresselhaus was a strong advocate for nanotube metrology and a pioneer in carbon nanotube optical physics. She wanted the advantages of these novel nanomaterials to be harnessed by industry and the world at large. Here we present a metrological perspective on SWCNT optics, covering only the most essential photophysics, discussing sample properties and conditions that affect optical characterization, and the current metrological application of the most important optical characterization methods. We give a perspective on the continued development of nanotube metrology. Standards meetings, technical specifications and other standard documents and protocols, as well as SWCNT reference materials are reviewed.
Citation
Optical Properties of Carbon Nanotubes – A Volume Dedicated to the Memory of Professor Mildred Dresselhaus.
Publisher Info
World Scientific Publishing Company, Hackensack, NJ
Created March 1, 2019, Updated April 15, 2020