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Method for Determining the Electrical Shape of a Scanning Probe Microscope Tip

Published

Author(s)

Joseph J. Kopanski, Malcolm Regan, Lin You

Abstract

Knowledge of the actual electrical tip shape can be used to better understand electric field gradients measured with eSPMs and to determine the suitability of various types of conducting SPM tips for electrical measurements. For co-axially shielded tips, the above technique is the only way to get an estimate of the electrical tip shape. Electrical tip shape may also prove useful in inverse modeling to improve the accuracy and spatial resolution of images of electrical properties with eSPMs.
Proceedings Title
Meeting Program of the 2018 Materials Research Society Meeting
Conference Dates
April 2-6, 2018
Conference Location
Phoenix, AZ
Conference Title
2018 Materials Research Society Meeting

Keywords

Electrical Scanning probe Microscopy, eSPM, scanning Kelvin force microscopy
Created April 2, 2018, Updated September 26, 2018