Method for Determining the Electrical Shape of a Scanning Probe Microscope Tip
Joseph J. Kopanski, Malcolm Regan, Lin You
Knowledge of the actual electrical tip shape can be used to better understand electric field gradients measured with eSPMs and to determine the suitability of various types of conducting SPM tips for electrical measurements. For co-axially shielded tips, the above technique is the only way to get an estimate of the electrical tip shape. Electrical tip shape may also prove useful in inverse modeling to improve the accuracy and spatial resolution of images of electrical properties with eSPMs.
Meeting Program of the 2018 Materials Research Society Meeting