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A Method to Compare Vector Nonlinear Network Analyzers



Kate Remley, Donald C. DeGroot, Jeffrey Jargon, Kuldip Gupta


We address the difficult problem of determining measurement consistency between two vector nonlinear network analyzers, a new class of stimulus-response instruments that acquire multiharmonic waveform data instead of normalized network parameters. We develop a set of nonlinear verification devices and a method to compare the systems, and then demonstrate that measurements from three different nonlinear network analyzers are consistent to within 1.3% of the amplitude of the applied stimulus signal.
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Conference Dates
May 20-25, 2001
Conference Location
Phoenix, AZ, USA


assurance, diode circuits, measurement, measurement consistency, measurement intercomparison, nonlinear measurements, nonlinear vector network analyzer, nonlinear verification


Remley, K. , DeGroot, D. , Jargon, J. and Gupta, K. (2001), A Method to Compare Vector Nonlinear Network Analyzers, Tech. Dig., IEEE MTT-S International Microwave Symposium, Phoenix, AZ, USA, [online],, (Accessed May 23, 2024)


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Created April 30, 2001, Updated October 12, 2021