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Meeting the Metrology Needs of the Microdisplay Industry

Published

Author(s)

Paul A. Boynton, Edward F. Kelley, John M. Libert

Abstract

Measuring the optical characteristics of microdisplays produce challenges to traditional display metrology. When using light-measuring devices to measure scenes having high contrasts or wide color variations, they suffer the effects of veiling glare or lens flare, thereby inaccurately measuring the luminance of color, especially for darker luminances. A simulated-eye-design (SED) camera is being developed to attempt to reduce unwanted light contamination by copying some of the characteristics of the human eye. A discussion of the first prototype and recent results will be presented. Adequately characterizing the reflection properties of a raw microdisplay can also prove difficult due to the presence of the haze component in the bidirectional reflectance distribution function (BRDF) and the bidirectional transmittance distribution function (BRTF). In the general case, there are a minimum of four parameters that are required to specify reflection: specular (distinct image), Lambertian, and haze with a peak and width (at a minimum). Thus, a minimum of four measurements are needed, and probably more than that to characterize reflection. Several simple techniques to better characterize reflections-- techniques that are readily accessible using simple equipment, will be reviewed: ambient reflection using the equivalent of an integrating sphere, (2) reflection of a small annulus (that allows the separation of the specular and haze peak), (3) reflection of a variable aperture source (also allows the separation of the haze peak and specular components), (4) simplified BRDF measurements avoiding the details of the peak, and (5) making CCD measurements to fully characterize the reflection properties (for those who have such equipment). Finally, the Video Electronic Standards Association (VESA) Display Metrology Committee (DMC) plans to incorporate microdisplay metrology into a future version of the Flat Panel Display Measurement (FPDM) standard will be discussed.
Proceedings Title
Proc., United Engineering Foundation Microdisplay Conference
Conference Dates
August 7-9, 2000
Conference Location
Boulder, CO, USA
Conference Title
United Engineering Foundation Microdisplay Conference

Keywords

microdisplay measurements, reflection metrology, simulated eye design

Citation

Boynton, P. , Kelley, E. and Libert, J. (2000), Meeting the Metrology Needs of the Microdisplay Industry, Proc., United Engineering Foundation Microdisplay Conference, Boulder, CO, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15431 (Accessed May 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 30, 2000, Updated October 12, 2021