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MeasuringThe Modulus of Polymer Films by Strain-Induced Buckling Instabilities
Published
Author(s)
Christopher M. Stafford, C Harrison, Alamgir Karim, Eric J. Amis
Abstract
We present a high-throughput technique for measuring the Young s modulus of thin polymer films. This technique exploits a strain-induced buckling instability observed in films supported on elastomeric substrates. By employing a combinatorial polymer film library where position on the sample dictates composition and/or thickness, one can measure via light scattering the moduli of hundreds of polymer films in minutes. We validate that this technique is robust for polystyrene films over a thickness range of 70-140 nm. The focus of this paper is the establishment of this technique and its application to films of thickness comparable to the polymer chain s radius of gyration where novel mechanical effects should arise.
Proceedings Title
American Chemical Society: Division of Polymer Chemistry, National Meeting | 24th | | American Chemical Society
Stafford, C.
, Harrison, C.
, Karim, A.
and Amis, E.
(2002),
MeasuringThe Modulus of Polymer Films by Strain-Induced Buckling Instabilities, American Chemical Society: Division of Polymer Chemistry, National Meeting | 24th | | American Chemical Society, Boston, MA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852030
(Accessed October 12, 2025)