Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Measuring Interfacial Roughness by Polarized Optical Scattering



Thomas A. Germer


Polarized optical scatter measurements yield information that can be used to identify sources of scatter. In this chapter, we review measurements of angle-resolved polarized optical scattering and their application to the measurement of roughness of surfaces and thin films.
Proceedings Title
Springer| 2006
Conference Dates
September 1, 2005
Conference Title
Light Scattering and Nanoscale Roughness


bidirectional reflectance, distribution function, interfacial roughness, nanotechnology, polarization, rough surfaces, thin film


Germer, T. (2005), Measuring Interfacial Roughness by Polarized Optical Scattering, Springer| 2006, [online], (Accessed April 15, 2024)
Created October 10, 2005, Updated February 17, 2017