Germer, T.
(2005),
Measuring Interfacial Roughness by Polarized Optical Scattering, Springer| 2006, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841926
(Accessed October 11, 2024)
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Measuring Interfacial Roughness by Polarized Optical Scattering
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Author(s)
Abstract
Polarized optical scatter measurements yield information that can be used to identify sources of scatter. In this chapter, we review measurements of angle-resolved polarized optical scattering and their application to the measurement of roughness of surfaces and thin films.Proceedings Title
Springer| 2006
Conference Dates
September 1, 2005
Conference Title
Light Scattering and Nanoscale Roughness
Pub Type
Conferences
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Keywords
bidirectional reflectance, distribution function, interfacial roughness, nanotechnology, polarization, rough surfaces, thin film
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Created October 10, 2005, Updated February 17, 2017