Measurements of Nonlinear Polarization Dynamics in the Tens of Gigahertz
Aaron Hagerstrom, Eric J. Marksz, Xiaohang Zhang, Xifeng Lu, Chris Long, James Booth, Ichiro Takeuchi, Nate Orloff
Frequency-dependent linear permittivity measurements are commonplace in the literature, providing key insights into the structure of dielectric materials. These measurements describe a material's dynamic response to a small applied electric eld. In contrast, nonlinear dielectric materials are widely used for their responses to large applied elds, including switching in ferroelectric materials, and eld-tuning of the permittivity in paraelectric materials. These behaviors are described by nonlinear permittivity. Nonlinear permittivity measurements are fraught with technical challenges because of the complex electrical coupling between a sample and its environment. Here, we describe a technique for measuring the complex nonlinear permittivity that circumvents many of the diculties associated with other approaches. We validate this technique by measuring a the nonlinear permittivity of a tunable Ba0:5Sr0:5TiO3 thin lm up to 40 GHz and comparing our results with a phenomenological model. These measurements provide insight into the dynamics of nonlinear dielectric materials down to picosecond timescales.
, Marksz, E.
, Zhang, X.
, Lu, X.
, Long, C.
, Booth, J.
, Takeuchi, I.
and Orloff, N.
Measurements of Nonlinear Polarization Dynamics in the Tens of Gigahertz, Applied Physics Reviews, [online], https://doi.org/10.1103/PhysRevApplied.13.044026
(Accessed December 4, 2023)