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Measurements of Nonlinear Polarization Dynamics in the Tens of Gigahertz

Published

Author(s)

Aaron Hagerstrom, Eric J. Marksz, Xiaohang Zhang, Xifeng Lu, Chris Long, James Booth, Ichiro Takeuchi, Nate Orloff

Abstract

Frequency-dependent linear permittivity measurements are commonplace in the literature, providing key insights into the structure of dielectric materials. These measurements describe a material's dynamic response to a small applied electric eld. In contrast, nonlinear dielectric materials are widely used for their responses to large applied elds, including switching in ferroelectric materials, and eld-tuning of the permittivity in paraelectric materials. These behaviors are described by nonlinear permittivity. Nonlinear permittivity measurements are fraught with technical challenges because of the complex electrical coupling between a sample and its environment. Here, we describe a technique for measuring the complex nonlinear permittivity that circumvents many of the diculties associated with other approaches. We validate this technique by measuring a the nonlinear permittivity of a tunable Ba0:5Sr0:5TiO3 thin lm up to 40 GHz and comparing our results with a phenomenological model. These measurements provide insight into the dynamics of nonlinear dielectric materials down to picosecond timescales.
Citation
Applied Physics Reviews
Volume
13
Issue
4

Citation

Hagerstrom, A. , Marksz, E. , Zhang, X. , Lu, X. , Long, C. , Booth, J. , Takeuchi, I. and Orloff, N. (2020), Measurements of Nonlinear Polarization Dynamics in the Tens of Gigahertz, Applied Physics Reviews, [online], https://doi.org/10.1103/PhysRevApplied.13.044026 (Accessed June 15, 2024)

Issues

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Created April 9, 2020, Updated February 16, 2022