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Measurement Services for Optoelectronics at NIST



Sally S. Bruce


The National Institute of Standards and Technololgy (NIST) offers a variety of hundreds of measurement services to its customers as a part of it's core mission. These services include reference data, reference materials, and physical measurements and calibrations.NIST'S work includes *maintaining primary standards, *developing new and improved measurement methods, * assisting industry, as a neutral party, to standardize on appropriate measurement methods, *calibrating measurement devices and instruments, and * providing reference materials, artifact standards, so that others may calibrate their own instruments.In the United States, optoelectronics components and equipment production comprise an estimated $20B industry. Measurement science plays an important role in characterizing and verifying the performance of optoelectronics currently available, it advances the performance of future optoelectronics, and enables the commerce of optoelectronics products.In the area of optoelectronic metrology, NIST has been developing measurement technology for lasers for nearly 40 years. Since the 1970s NIST has been developing measurement technology for optical fiber communications and assisting with the development of measurement standards. NIST has Standard Reference Materials for integrated optic components, optical data storage, and semiconductor lasers and LEDs under development. Researchers at NIST have also been studying and modeling color and other electroluminescent properties of LEDs.Historically, NIST has provided radiometric calibrations. Part of the suite of radiometric measurements that NIST provides include: photometric and detector responsivity both of which support the optoelectronics industry.This paper will provide an overview of the suite of measurement services that NIST currently offers to support the optoelectronics community.
International Conference on the Electro Chemical Society


calibration, measurement services, optoelectronics


Bruce, S. (1999), Measurement Services for Optoelectronics at NIST, International Conference on the Electro Chemical Society (Accessed April 23, 2024)
Created June 16, 1999, Updated June 26, 2017